Measures large objects up to 2.5 x 2.5 m
Measurement accuracy <10µm, even at the largest size
Measurement results in less than 5 minutes
100s of times greater sampling than CMMs or laser trackers
No surface contact required
And we're doing more every day...
We're advancing our methods toward nanometer level accuracy on reflective surfaces such as semiconductor wafers, optical mirrors, and lenses, through our National Science Foundation SBIR Grant.
If this sounds exciting to you, contact us to request our newsletter for regular updates on our progress!
Application
Steel molds
Application
Damage Analysis
Application
Radio Telescope Panels
