In 2021, we realized there was a gap in meeting the needs of surface measurement while being involved in the development to manufacture radio telescope panels. Surfaces that are not specular can’t be measured with highly accurate and precise methods based on surface reflection, such as interferometry. Radio antennas, on the other hand, need to be very accurately shaped while being non-reflective in order to scatter sunlight. But, if you can’t measure it, you can’t make it.
Previously, the measurement options to use consisted of a laser tracker, a CMM, or an industrial photogrammetry system that requires sticker fiducials. All these methods either suffer from high cost, low spatial resolution, or limitations on the physical size of the object to be measured.
We combined concepts from photogrammetry, fringe projection profilometry, and super-resolution to produce a measurement system that is as precise and accurate as other methods, scalable to a variety of surface sizes, shapes, and types and delivers one-of-a-kind results, revealing surface properties that go unseen by other methods.
Our goal is to supply customers with an affordable, extremely accurate, and easy-to-use customizable measurement method. We understand that challenging manufacturing situations often come with challenging measurement requirements, and that’s why we aim to ensure our metrology systems meet the needs of those situations to alleviate the pain of finding a suitable measurement solution.
5 years of experience in optical engineering and optical metrology covering everything from ultraviolet spectroscopy to large telescope design to radio telescope manufacturing. My passion is developing tools that dramatically improve the process of taking a project from design concept to fully functioning prototype/product, whether it be for astronomy, biomedical sciences, or autonomous vehicles.
Expertise in curved surface fabrication, optical engineering, and optical metrology. Justin has degrees in mechanical engineering, English, astronomy, and optical science.