See the Unseen
A new class of surface metrology.
What is SLA?
Structured Light Autocollimation (SLA) is a fundamentally new class of surface metrology. Rooted in the 100-year-old principle of autocollimation, SLA evolves this proven optical method into a fully digital, high-resolution measurement platform.
The Limits of Conventional Metrology
Interferometers are precise but fragile, defect inspection tools can flag issues but offer poor visualization and no slope or shape, and production systems sacrifice sensitivity for stability. No existing tool captures slope, shape, and defects in a single measurement.
One Measurement, Full Understanding
SLA captures slope, shape, and defects together in a single measurement — something no conventional tool has ever been able to do. It combines interferometric precision, robust acquisition, and intuitive surface visualization, delivering clear, actionable insight across subtle features and large-scale form in the same shot.
Scalable By Design
Our 16 mm aperture prototype showcases the full capability of SLA in a compact, stable package. Because the architecture is entirely digital and telecentric, we can scale aperture, speed, and resolution to meet a wide range of surface metrology needs:
1 mm – 300 mm aperture
1 μm – 65 μm lateral resolution
< 1 nm RMS absolute repeatability
<0.01 nm repeatability of RMS
<λ/20 RMS accuracy
<5 seconds per measurement
Pilot units are available for preorder, with initial deliveries planned for 2026.
Let’s chat about your metrology challenges.
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