We bring micron-level accuracy to large scale metrology.
Our systems measure objects up to 2.5 meters with accuracy <10 microns. We deliver full-field results in less than 2 minutes, offering hundreds of times greater sampling density than CMMs or laser trackers, with zero surface contact.
Learn MoreNanometer-level accuracy for wafers and more.
The Structured Light Autocollimator (SLA) captures slope, shape, and complex defects all at once, giving manufacturers a complete picture of the surface in one shot.
Learn MoreCUSTOMERS/PARTNERS
